JPH046887B2 - - Google Patents
Info
- Publication number
- JPH046887B2 JPH046887B2 JP57141067A JP14106782A JPH046887B2 JP H046887 B2 JPH046887 B2 JP H046887B2 JP 57141067 A JP57141067 A JP 57141067A JP 14106782 A JP14106782 A JP 14106782A JP H046887 B2 JPH046887 B2 JP H046887B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- current
- circuit
- gauge
- bridge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
- G01L9/0051—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
- G01L9/0052—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements
- G01L9/0054—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements integral with a semiconducting diaphragm
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
- G01L9/06—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
- G01L9/065—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices with temperature compensating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S323/00—Electricity: power supply or regulation systems
- Y10S323/907—Temperature compensation of semiconductor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Fluid Pressure (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57141067A JPS5931404A (ja) | 1982-08-16 | 1982-08-16 | 圧力センサ回路 |
EP83107850A EP0106050B1 (en) | 1982-08-16 | 1983-08-09 | Pressure transducer with temperature compensation circuit |
DE8383107850T DE3373343D1 (en) | 1982-08-16 | 1983-08-09 | Pressure transducer with temperature compensation circuit |
US06/522,227 US4556807A (en) | 1982-08-16 | 1983-08-11 | Pressure transducer with temperature compensation circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57141067A JPS5931404A (ja) | 1982-08-16 | 1982-08-16 | 圧力センサ回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5931404A JPS5931404A (ja) | 1984-02-20 |
JPH046887B2 true JPH046887B2 (en]) | 1992-02-07 |
Family
ID=15283467
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57141067A Granted JPS5931404A (ja) | 1982-08-16 | 1982-08-16 | 圧力センサ回路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4556807A (en]) |
EP (1) | EP0106050B1 (en]) |
JP (1) | JPS5931404A (en]) |
DE (1) | DE3373343D1 (en]) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4658829A (en) * | 1985-10-10 | 1987-04-21 | Utah Medical Products, Inc. | Method and apparatus for pressure transducer calibration and simulation |
US4798093A (en) * | 1986-06-06 | 1989-01-17 | Motorola, Inc. | Apparatus for sensor compensation |
JPH0542355Y2 (en]) * | 1986-11-28 | 1993-10-26 | ||
US4736155A (en) * | 1987-03-06 | 1988-04-05 | Colt Industries Inc | Transducer temperature control circuit and method |
US4766763A (en) * | 1987-05-05 | 1988-08-30 | Kulite Semiconductor Products, Inc. | Gas leak detection apparatus and methods |
US4866640A (en) * | 1987-08-20 | 1989-09-12 | Granville-Phillips Company | Temperature compensation for pressure gauge |
US4883992A (en) * | 1988-09-06 | 1989-11-28 | Delco Electronics Corporation | Temperature compensated voltage generator |
US4970497A (en) * | 1989-11-22 | 1990-11-13 | Westinghouse Electric Corp. | Method and apparatus for sensing thermal stress in integrated circuits |
US5087831A (en) * | 1990-03-30 | 1992-02-11 | Texas Instruments Incorporated | Voltage as a function of temperature stabilization circuit and method of operation |
JPH0495741A (ja) * | 1990-08-07 | 1992-03-27 | Seiko Epson Corp | 圧力センサ |
JPH0495742A (ja) * | 1990-08-07 | 1992-03-27 | Seiko Epson Corp | 圧力センサ |
US5146788A (en) * | 1990-10-25 | 1992-09-15 | Becton, Dickinson And Company | Apparatus and method for a temperature compensation of a catheter tip pressure transducer |
JP2612100B2 (ja) * | 1991-02-01 | 1997-05-21 | 三菱電機株式会社 | 半導体圧力センサ |
JP3264689B2 (ja) * | 1992-04-07 | 2002-03-11 | 三菱電機株式会社 | 半導体圧力センサ用の圧力検出回路 |
US5604467A (en) * | 1993-02-11 | 1997-02-18 | Benchmarg Microelectronics | Temperature compensated current source operable to drive a current controlled oscillator |
US5568815A (en) * | 1994-11-21 | 1996-10-29 | Becton Dickinson And Company | Self-powered interface circuit for use with a transducer sensor |
FR2727534A1 (fr) * | 1994-11-30 | 1996-05-31 | Sgs Thomson Microelectronics | Regulateur de tension pour circuit logique en mode couple |
JP3954245B2 (ja) | 1999-07-22 | 2007-08-08 | 株式会社東芝 | 電圧発生回路 |
US6566849B1 (en) * | 2002-02-12 | 2003-05-20 | Delphi Technologies, Inc. | Non-linear temperature compensation circuit |
JP2003294559A (ja) * | 2002-03-29 | 2003-10-15 | Denso Corp | センサ回路 |
US20070237207A1 (en) | 2004-06-09 | 2007-10-11 | National Semiconductor Corporation | Beta variation cancellation in temperature sensors |
JP2006029931A (ja) * | 2004-07-15 | 2006-02-02 | Hitachi Ltd | 建築構造物損傷検知装置 |
US7117747B2 (en) * | 2005-01-03 | 2006-10-10 | Delphi Technologies, Inc. | Integrated pressure sensor and method of manufacture |
US7207224B2 (en) * | 2005-06-10 | 2007-04-24 | Brooks Automation, Inc. | Wide-range combination vacuum gauge |
US7418869B2 (en) * | 2005-06-10 | 2008-09-02 | Brooks Automation, Inc. | Wide-range combination vacuum gauge |
US7931447B2 (en) | 2006-06-29 | 2011-04-26 | Hayward Industries, Inc. | Drain safety and pump control device |
EP2526300B1 (en) | 2010-02-25 | 2020-04-22 | Hayward Industries, Inc. | Universal mount for a variable speed pump drive user interface |
US8878598B2 (en) * | 2010-12-28 | 2014-11-04 | British Virgin Islands Central Digital Inc. | Sensing module |
US8388374B2 (en) | 2011-04-12 | 2013-03-05 | Amphenol Corporation | Coupling system for electrical connector assembly |
EP2822105A1 (en) | 2013-02-05 | 2015-01-07 | Amphenol Corporation | Coupling system for electrical connector assembly |
ES2994852T3 (en) | 2013-03-15 | 2025-02-03 | Hayward Ind Inc | Modular pool/spa control system |
JP2016003977A (ja) * | 2014-06-18 | 2016-01-12 | セイコーエプソン株式会社 | 物理量センサー装置、高度計、電子機器および移動体 |
US11720085B2 (en) | 2016-01-22 | 2023-08-08 | Hayward Industries, Inc. | Systems and methods for providing network connectivity and remote monitoring, optimization, and control of pool/spa equipment |
US10363197B2 (en) | 2016-01-22 | 2019-07-30 | Hayward Industries, Inc. | Systems and methods for providing network connectivity and remote monitoring, optimization, and control of pool/spa equipment |
CN105806521A (zh) * | 2016-05-25 | 2016-07-27 | 深圳市欧利德仪器仪表有限公司 | 一种陶瓷压力传感器 |
US10718337B2 (en) | 2016-09-22 | 2020-07-21 | Hayward Industries, Inc. | Self-priming dedicated water feature pump |
CN110006585B (zh) * | 2019-05-06 | 2023-10-24 | 上海掌门科技有限公司 | 一种压力传感器的数据采集装置及方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3836796A (en) * | 1973-09-24 | 1974-09-17 | Nat Semiconductor Corp | Semiconductor pressure transducer employing novel temperature compensation means |
US4000643A (en) * | 1976-03-29 | 1977-01-04 | Honeywell Inc. | Apparatus for producing a compensating voltage |
US4079308A (en) * | 1977-01-31 | 1978-03-14 | Advanced Micro Devices, Inc. | Resistor ratio circuit construction |
US4233848A (en) * | 1978-01-06 | 1980-11-18 | Hitachi, Ltd. | Strain gauge pressure transducer apparatus having an improved impedance bridge |
JPS5832646B2 (ja) * | 1978-09-08 | 1983-07-14 | 株式会社東芝 | 圧力伝送器 |
US4300395A (en) * | 1978-11-08 | 1981-11-17 | Tokyo Shibaura Denki Kabushiki Kaisha | Semiconductor pressure detection device |
JPS5663227A (en) * | 1979-10-30 | 1981-05-29 | Toshiba Corp | Pressure detecting device |
US4320664A (en) * | 1980-02-25 | 1982-03-23 | Texas Instruments Incorporated | Thermally compensated silicon pressure sensor |
US4446527A (en) * | 1980-03-07 | 1984-05-01 | Rockwell International Corporation | High accuracy measuring apparatus |
US4325018A (en) * | 1980-08-14 | 1982-04-13 | Rca Corporation | Temperature-correction network with multiple corrections as for extrapolated band-gap voltage reference circuits |
US4355537A (en) * | 1980-11-06 | 1982-10-26 | Combustion Engineering, Inc. | Temperature compensation for transducer components |
US4463274A (en) * | 1982-02-01 | 1984-07-31 | Motorola, Inc. | Temperature compensation circuit for pressure sensor |
-
1982
- 1982-08-16 JP JP57141067A patent/JPS5931404A/ja active Granted
-
1983
- 1983-08-09 EP EP83107850A patent/EP0106050B1/en not_active Expired
- 1983-08-09 DE DE8383107850T patent/DE3373343D1/de not_active Expired
- 1983-08-11 US US06/522,227 patent/US4556807A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3373343D1 (en) | 1987-10-08 |
US4556807A (en) | 1985-12-03 |
EP0106050B1 (en) | 1987-09-02 |
JPS5931404A (ja) | 1984-02-20 |
EP0106050A1 (en) | 1984-04-25 |
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